BEST FOR
– Source characterization
– Real-time alignment of optical systems, e.g., KB, toroidal, etc.
– Phase imaging of biological material, nanoparticles, archeological artifacts
– Precise driving of X-Ray active optics
BEST FOR VERSATILITY
– A great choice for lab or industrial application
– Successfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
– Optimize the alignment of complex systems
– On and off-axis 3D MTF
BEST FOR CHALLENGING APPLICATIONS
– High spatial sampling frequency
– Very large dynamic range
– Freeform optics characterization
– Parabolic mirrors characterization
– High spatial frequency aberrations
Thousands of measurement points in the beam
Can accomodate near-field and far-field measurement
Spatio-spectral couplings measurements : angular dispersion, spectral focal shift, etc
Lightweight laptop-friendly software
SpotTracker auto-align technology
KEY SPECS
550 – 1000 nm spectral range
Very high spectral and spatial resolution
1Hz repetition rate, for standard [750-850] nm spectral range with 1nm resolution
Input beam : Collimated (default) – Any F/# (optional)
BEST FOR
Physicists, laserists, and laser systems designers
Compressors alignment
Spatio-spectral couplings understanding and control
Characterization of compressed beam down to 5fs
Broadband systems alignment
BEST FOR VERSATILITY
– High spacial samplig frequency
– Very large dynamic range
– Freeform optics characterization
– Parabolic mirrors characterization
– High spacial frequency aberrations
– A great choice for lab or industrial application
– Sucessfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
– Optimizes the aligment of complex systems
– On and off-axis 3D MTF
BEST FOR
– Adaptive Optics applications for microscopy or UHIL
– OEM applicaitons in optical metrology and beam diagnostics
– AO for high-power laser optimization
BEST FOR
– Optical metrology
– Adaptive optics applications such as long-range communication
– Optimizing the alignment of complex systems
– Light-source characterization
