BEST FOR VERSATILITY
– Characterize optical surfaces
– Characterize chromatic aberrations
– Analyze the transmitted wavefront of optical systems with double-pass configuration
– Optimize the alignment of complex systems
– On and off-axis 3D MTF
KEY SPECS
– Multiple options as per focusing objectives and collimating beam sizes
– λ/200 RMS measurement accuracy in double-pass configuration
– Insensitive to vibrations and atmospheric turbulence
The R-FLEX2 SWIR metrology system is the second generation of our versatile optical metrology system in the 1000-1700 nm range. It instantly combines our HASO4 SWIR or HAS04 SWIR 1550 wavefront sensors with a collimator and a light source.
