MESO Metrology System

 info@lasphotonics

KEY FEATURES​

  • Insensitive to vibrations​
  • At-design wavelength testing​
  • Insensitive to reflections from sample back surface​​

Description

MESO metrology system is a one-stop solution to many challenges in optical metrology. Shop floor measurements ensure quality control testing and in situ process control of your flat optics right next to the manufacturing line.
A unique instrument allows to measure at several different wavelengths with no achromatism and to characterize the whole range of your optics with no loss of resolution.

MESO™ is packed with innovation:

– LIFT-enhanced high wavefront sensing resolution
– POP-patent pending procedure for the testing of (thin) plane parallel optics
– Spot Tracker™ proprietary technology provides absolute measurement of tilt and wavefront.


Ask us about - MESO Metrology System